Zur objektiven bewertung des nachweisvermögens in der emissionsspektrographie—IV Abhängigkeit des zufallsfehlers von der grösse des messwertes |
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| Authors: | G. Ehrlich H. Scholze R. Gerbatsch |
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| Affiliation: | Institut für Metallphysik und Reinstmetalle der Deutschen Akademie der Wissenschaften zu Berlin DDR-8020 Dresden, Winterbergstraße 28, German Democratic Republic |
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| Abstract: | A formula describing the dependence of the statistical error from the measured quantity is derived for emission spectrographic trace analysis and confirmed experimentally in three special cases. The general importance of the lower range of such functions for the objective estimation and exhaustive utilization of the detection capacity of analytical procedures is discussed as well as their limits of applicability. |
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