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Optical and structural characterization of ultrananocrystalline diamond/hydrogenated amorphous carbon composite films deposited via coaxial arc plasma
Authors:Abdelrahman Zkria  Fouad Abdel-Wahab  Yuki Katamune  Tsuyoshi Yoshitake
Institution:1. Department of Applied Science for Electronics and Materials, Kyushu University, Kasuga, Fukuoka, 816-8580, Japan;2. Department of Physics, Faculty of Science, Aswan University, Aswan, 81542, Egypt;3. Department of Physics, Faculty of Science, Taif University, P.O. Box 888, Al Taif, Saudi Arabia;4. Department of Electrical and Electronics Engineering, Kyushu Institute of Technology, Tobata ku, Kitakyushu, 804-8550, Japan
Abstract:Ultrananocrystalline diamond/hydrogenated amorphous carbon composite films were deposited in the ambient of hydrogen by coaxial arc plasma deposition. The film compositions and chemical bonding structures were investigated by X-ray diffraction, X-ray photoemission and hydrogen forward scattering spectroscopies. The sp3/(sp2+sp3) ratio and hydrogen content in the film were estimated to be 64% and 35?at.%, respectively. The optical parameters and the optical dispersion profile were determined by using a variable angle spectroscopic ellipsometer at 55°, 65° and 75° angle of incidence in the photon energy range of 0.9–5?eV. Combinations of multiple Gaussian, and Tauc-Lorentz or Cody-Lorentz dispersion functions are used to reproduce the experimental data. Results of ellipsometry showed a refractive index of approximately 2.05 (at 2eV) and optical band gap of 1.63?eV. The imaginary part of dielectric function exhibited a peak at 3.8?eV, which has assigned to π-π* electron transitions. Furthermore, Electron spin resonance measurements implied the existence of dangling bonds, which might have a partial contribution to the optical absorption properties of the deposited films. A correlation between optical parameters and structural profile of the deposited films is discussed.
Keywords:Ultrananocrystalline diamond  Coaxial arc plasma deposition  Spectroscopic ellipsometry  Optical parameters  Electron spin resonance
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