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Si和GaAs衬底上的ZnTe、CdTe分子束外延材料的晶向倾角
引用本文:王元樟,陈路,巫艳,吴俊,于梅芳,方维政,何力.Si和GaAs衬底上的ZnTe、CdTe分子束外延材料的晶向倾角[J].人工晶体学报,2005,34(4):649-652.
作者姓名:王元樟  陈路  巫艳  吴俊  于梅芳  方维政  何力
作者单位:中国科学院上海技术物理研究所,功能材料与器件研究中心,上海,200083;中国科学院研究生院,北京,100039;中国科学院上海技术物理研究所,功能材料与器件研究中心,上海,200083
基金项目:国家自然科学基金(No.60221502)资助项目
摘    要:本文采用X射线双晶衍射二次测量法对φ76mm Si(211)和GaAs(211)B衬底上生长的ZnTe和CdTe外延层的晶向倾角进行了测量,发现对于Si和GaAs衬底,外延层的211]均绕外延层与衬底的0-11]复合轴朝111]倾斜,其晶向倾角与晶格失配呈线性关系;通过实际测量验证了在外延层探测到的133]峰代表211]关于111]旋转180°的255]孪晶向.

关 键 词:分子束外延  晶格失配  晶向倾角  孪晶
文章编号:1000-985X(2005)04-0649-04
收稿时间:11 25 2004 12:00AM
修稿时间:2004-11-252004-12-09

Tilted Angels of ZnTe and CdTe Epilayers Grown on Si(211) and GaAs(211)B Substrates by MBE
WANG Yuan-Zhang,CHEN Lu,WU Yan,WU Jun,YU Mei-Fang,FANG Wei-zheng,HE Li.Tilted Angels of ZnTe and CdTe Epilayers Grown on Si(211) and GaAs(211)B Substrates by MBE[J].Journal of Synthetic Crystals,2005,34(4):649-652.
Authors:WANG Yuan-Zhang  CHEN Lu  WU Yan  WU Jun  YU Mei-Fang  FANG Wei-zheng  HE Li
Institution:WANG Yuan-zhang~
Abstract:Measurements using X-ray double crystal diffraction(XDCD) were carried out to investigate the tilted angels of ZnTe and CdTe epilayers grown on 76mm Si(211) and GaAs(211)B substrates by molecular-beam epitaxy. The results show that the epilayer's tilts toward about the coincidence axis, independent of the substrates employed. Further more, a linear relationship of tilted angles and lattice mismatch between the epilayer and substrate was found. It was also confirmed that peak of the epilayer corresponds to 255], which is the first-order twin of about twist axis.
Keywords:MBE  lattice mismatch  tilted angel  twin crystal
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