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Fraunhofer diffraction of a plane wave by an elliptical annular aperture with offset or tilt
Authors:Toshiyuki Tanaka   Mitsuo Taguchi  Kazumasa Tanaka
Affiliation:

Nagasaki University, Faculty of Engineering, Department of Electrical Engineering and Computer Science, Nagasaki 852, Japan

Abstract:Fraunhofer diffraction field through an elliptical annular aperture is obtained for plane wave incidence when there is offset or tilt of the inner ellipse. The effects are observed through the field distribution.
Keywords:
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