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Method for measuring retardation of a quarter-wave plate based on normalized secondary harmonic component |
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| Authors: | Kun Yang Aijun Zeng Hua Wang |
| Affiliation: | a Shanghai Institute of Optics and Fine Mechanics, The Chinese Academy of Sciences, Shanghai 201800, China b Shanghai Hengyi Optics & Fine Mechanics Co., Ltd., Shanghai 201800, China c Graduate School of the Chinese Academy of Sciences, Beijing 100039, China |
| Abstract: | A method for measuring retardation of a quarter-wave plate based on normalized secondary harmonic component is proposed, and the measuring principle is analyzed. The optical measuring system is composed of a laser, a polarizer, a phase modulator, the quarter-wave plate to be measured, an analyzer and a detector. The azimuths of the transmission axes of the polarizer and the analyzer with respect to the modulating axis of the phase modulator are +45°, 0°, respectively. The retardation of the quarter-wave plate is calculated precisely using the normalized secondary harmonic components prior to and after 22.5° rotation of the quarter-wave plate. In this method, the major axis position of the quarter-wave plate is not required to be known in advance, and the measured retardation is independent of the intensity fluctuation of the light source. The feasibility of the method is verified by the experiments. |
| Keywords: | Polarization Quarter-wave plate Retardation Phase modulation Jones matrix |
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