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Atomic structural variations of [0 0 0 1]-tilt grain boundaries during ZnO grain growth occurred by thermal treatments
Authors:JM YukJY Lee  Zonghoon LeeYS No  TW Kim  JY KimWK Choi
Institution:a Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 305-701, Republic of Korea
b National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
c National Research Laboratory for Nano Quantum Electronics Devices, Department of Electronics and Computer Engineering, Hanyang University, Seoul 133-791, Republic of Korea
d Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Republic of Korea
e Thin Film Materials Research Center, Korea Institute of Science and Technology, Seoul 136-791, Republic of Korea
Abstract:
Keywords:68  37  Lp  68  56  Hp
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