Normalization of intensity curves in X-ray diffraction by disordered systems |
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| Authors: | V É Sokol’skii V P Kazimirov V A Shovskii Ya I Stetsiv |
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| Institution: | (1) University L’vivs’ka Politekhnika, L’viv, Ukraine;(2) Kiev State University, ul. Glushkova 6, Kiev, 252127, Ukraine |
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| Abstract: | The application of the method of graphic construction of the background line (widely used in electron diffraction analysis of amorphous films) to the normalization of X-ray intensity curves obtained by the “ reflection” method has been considered. |
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