| 电荷耦合器件光电响应特性标定研究 |
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| 引用本文： | 李恩德, 段海峰, 杨泽平, 等. 电荷耦合器件光电响应特性标定研究[J]. 强激光与粒子束, 2006, 18(02). |
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| 作者姓名： | 李恩德 段海峰 杨泽平 王海英 张雨东 |
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| 作者单位： | 1.中国科学院 光电技术研究所, 成都 61 0209;;;2.中国科学院 研究生院, 北京 1 00080 |
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| 摘 要： | 电荷耦合器件(CCD)光电输入输出响应特性是其用于光束远近场能量分布测量的重要参数，介绍一种新的标定方法——小孔衍射方法：即利用小孔衍射图像的零级谱的能量相对分布作为CCD能量的标准参考输入，依据最小二乘拟合准则，根据CCD的灰度输出标定其响应特性。介绍了数据处理方法并完成了校核实验及误差分析。
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| 关 键 词： | 电荷耦合器件（CCD） 光电响应特性 小孔衍射 |
Method of calibrating CCD optics-electron characteristic |
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| li en-de, duan hai-feng, yang ze-ping, et al. Method of calibrating CCD optics-electron characteristic[J]. High Power Laser and Particle Beams, 2006, 18. |
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| Authors: | li en-de duan hai-feng yang ze-ping wang hai-ying zhang yu-dong |
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| Affiliation: | 1. Institute of Optics and Electronics,Chinese Academy of Sciences,P.O.Box 350,Chengdu 610209,China;;;2. Graduate School of the Chinese Academy of Sciences,Beijing 100080,China |
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| Abstract: | The CCD’s optics-electron characteristic is an important parameter when it is applied to measuring the energy distribution of laser’s far-field and near-field. A new method of calibrating the CCD’s optics-electron characteristic is introduced in this paper. The method uses the zeroth order energy-distribution caused by the pinhole diffraction as the CCD’s fiducial input energy. According to the CCD’s output data sampling the pinhole diffraction, the optics-electron characteristic curve is calculated through the least-square algorithm. The data process procedure, the validation experimental result and the analysis of its residual error are presented. |
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| Keywords: | charge coupled device(ccd) optics-electron characteristic pinhole diffraction |
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