Experimental setup for determining the carrier mobility using a transit time technique

A new scheme of the experimental setup for measuring the carrier mobility in thin films of organic semiconductor materials was proposed. Major factors controlling the time of exponential relaxation of the measuring system were analyzed. On this basis, conclusions were made on operating parameters of the measuring equipment required to reduce as much as possible the relaxation time. According to this, a new setup was developed. A qualitative improvement of current kinetic curves for a control sample was experimentally shown using the new setup. This allowed determination of transit times and carrier mobilities with high reliability.