Röntgenografische Untersuchung des Debye-Waller-Faktors und der Gitterkonstanten von V3Si-Pulver im Temperaturbereich von 25 K bis 1000K

The temperature dependence of the integrated X-ray diffracted intensities and the Bragg-angles in powdered V₃Si has been determined in the temperature range 25 K to 1000 K. The measured intensities could be described with an isotropic-quasiharmonic Debye-Waller-factor. An anomalous temperature dependence of the Debye-Waller-factor in the vicinity of the martensitic transition temperature could not be find. The temperature dependence of the linear thermal expansion below 100 K were observed to decrease rapidly with the temperature (and has a negativ sign below 70 K).