Investigations of crystal defects with reflection-section topography

A simple topographic technique is presented that allows an exact determination of the depth of kinematically reflecting regions below the crystal surface. A kinematical reflection full of contrast can be achieved by a spatial separation of the images from perfect and disturbed parts of the crystal. Possible applications of reflection-section topography are e.g. demonstrated by lattice deformations caused by laser irradiation and ion implantation as well as by growth bands and dislocations. In weakly deformed crystals a new kind of interference fringes can be observed.