Amorphous semiconducting AsSeI |
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Authors: | H Rodot A Hrubý J Horák |
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Institution: | (1) Centre Nationale de la Recherche Scientifique, Laboratoires de Bellevue, France;(2) Institute of Solid State Physics, Czechosl. Acad. Sci., Cukrovarnická 10, Praha 6, Czechoslovakia;(3) Technical University of Chemistry and Technology, Leninovo nám. 565, Pardubice, Czechoslovakia |
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Abstract: | It is shown on the basis of differential thermal analysis (DTA) of AsSeI samples that a reliable technique ensuring reproducible preparation of vitreous AsSeI has been found. The values of the softening and melting points are 50 °C and 220 °C, respectively.Transmittance study has been done on glasses of general compositionxAs2Se3+(1–x). AsSeI (forx=1.0; 0.8; 0.4; 0.0). Samples in the form of slabs of different thickness (d=0.2; 0.5; 1.0; 2.0 mm) were used to determine the wavelength dependence of the absorption coefficientK. On the basis of the results of the quoted measurements performed on thin As2Se3 layers in the high absorption region, the optical gap width of vitreous semiconducting AsSeI has been extrapolated, using certain simplified conceptions mentioned in the paper. The value ofE
g at 293 °K and its temperature dependence coefficient=(E
g/T)p for AsSeI were found to be 1.91 eV and –6.7×10–4eV/grad, respectively. |
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