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Characterization of oxide layers formed on electrochemically treated Ti by using soft X-ray absorption measurements |
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| Authors: | RG Wilks E Santos Jr EZ Kurmaev MV Yablonskikh A Moewes NK Kuromoto GA Soares |
| Institution: | 1. University of Saskatchewan, Department of Physics and Engineering Physics, 116 Science Place, Saskatoon, SK, S7N 5E2 Canada;2. Federal University of Rio de Janeiro, Metallurgy and Materials Engineering/COPPE, P.O. Box 68505, 21941-972 Rio de Janeiro, RJ, Brazil;3. Institute of Metal Physics, Russian Academy of Sciences - Ural Division, 620219 Yekaterinburg GSP-170, Russia;4. Federal University of Paraná, Department of Physics, P.O. Box 19044, 81531-990, Curitiba, PR, Brazil |
| Abstract: | The oxide layers of electrolytic oxidized titanium (Ti) were characterized using Ti L2,3 and O K edge X-ray absorption. The spectra show that the structure of the oxide layers that are formed during a 1 min treatment are dependent on the concentration of the electrolyte (H2SO4 or Na2SO4) with which the Ti surface was treated, and also on the magnitude of the potential that was applied during the anodic oxidation process (100 V or 150 V). It is found that a potential of 150 V and an electrolyte concentration of 0.5 M or 1.0 M produces a layer of TiO2 having rutile crystal structure. |
| Keywords: | Ti oxide films Anodic oxidation XANES Atomic force microscopy Bioactivity |
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