| 光折变BaTiO3晶体缺陷的分析电子显微镜研究 |
| |
| 引用本文： | 杨翠英,张道范,吴星,周玉清,冯国光. 光折变BaTiO3晶体缺陷的分析电子显微镜研究[J]. 物理学报, 1989, 38(12): 2003-2007 |
| |
| 作者姓名： | 杨翠英 张道范 吴星 周玉清 冯国光 |
| |
| 作者单位： | (1)中国科学院物理研究所; (2)中国科学院物理研究所,北京电子显微镜实验室 |
| |
| 摘 要： | 用分析电子显微镜研究了顶部籽晶法生长的BaTiO3晶体内的缺陷。成功地制备出薄区厚约100nm内含包裹体的电子显微镜样品。用透射电子显微镜(TEM),配合电子能量损失谱(EELS)确定了BaTiO3单晶内包裹体的相分为:非晶的Ba-Ti-O和高Ti-Ba氧化物——Ba6Ti17O40在BaTiO3单晶试样中,还观察到其它几种类型的微缺陷。关键词：
|
| 关 键 词： | 晶体缺陷 BaTiO3 电子显微镜 |
| 收稿时间： | 1989-02-15 |
ANALYTICAL ELECTRON MICROSCOPY OF DEFECTS IN PHOTOREFRACTIVE BaTiO3 CRYSTAL |
| |
| YANG CUI-YING,ZHANG DAO-FAN,WU XING,ZHOU YU-QING and FENG GUO-GUANG. ANALYTICAL ELECTRON MICROSCOPY OF DEFECTS IN PHOTOREFRACTIVE BaTiO3 CRYSTAL[J]. Acta Physica Sinica, 1989, 38(12): 2003-2007 |
| |
| Authors: | YANG CUI-YING ZHANG DAO-FAN WU XING ZHOU YU-QING FENG GUO-GUANG |
| |
| Abstract: | Defects in photorefractive BaTiO3 crystal, obtained by the top seed solution growth method, have been studied by analytical electron microscopy. Thin foils containing inclusions for transmission electron micrsocopy (TEM) were prepared by ion milling the mechanically polished thin sections. Combining diffraction and electron energy loss spectroscopy in a TEM, the inclusions were identified as amorphous Ba-Ti-O and Ba6Ti17O40. Other microdefects which are only visible in the TEM have been identified as crystalline precipitates. |
| |
| Keywords: | |
| 本文献已被 CNKI 维普 等数据库收录！ |
| 点击此处可从《物理学报》浏览原始摘要信息 |
|
点击此处可从《物理学报》下载免费的PDF全文 |
|
