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基于AVR ATmega169的张力检测仪设计
引用本文:王海棠,黄琦兰. 基于AVR ATmega169的张力检测仪设计[J]. 现代电子技术, 2006, 29(22): 9-11
作者姓名:王海棠  黄琦兰
作者单位:天津工业大学,天津,300160
摘    要:分析应变测量原理,应用应变片敏感栅作为传感器,结合仪表放大器电路和高集成度的单片机ATmega169实现低功耗便携式张力测试仪的设计。该系统功耗低、测量准确、直接数字读出,具有多种附加功能。成功解决了由经验判断引起的偏误过大问题。给出在实际应用中硬件电路和软件程序的实现方案。分析设计中常见的问题,并给出解决问题的思路。对相关的测量仪表设计、开发有一定参考作用。

关 键 词:AVR  ATmega169  应变计  仪表放大器
文章编号:1004-373X(2006)22-009-03
修稿时间:2006-05-11

Design of Strain Gauge Based on AVR ATmega169
WANG Haitang,HUANG Qilan. Design of Strain Gauge Based on AVR ATmega169[J]. Modern Electronic Technique, 2006, 29(22): 9-11
Authors:WANG Haitang  HUANG Qilan
Abstract:The paper analyzes the theory of strain gauge measurement,finishes the strain gauge tester design through applying strain gauge active grid as sensor element,rail to rail low voltage op-amp as instrument amplifier and high density integrated ATmega169 microcomputer as the processor.It takes on low power consumption,high accuracy measurement,LCD display and other auxiliary functions.It solving the problem of high measurement error caused by subjective judgment.The paper introduces the design idea of the hardware circuit and software program in practical application.Analyzing the probable problem in design and giving the idea of solving it.It helps to design or development of relevant measurement instruments.
Keywords:AVR  ATmega169  strain gauge  instrument amplifier
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