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Expanding the view into complex material systems: From micro-ARPES to nanoscale HAXPES |
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| Authors: | CM Schneider C Wiemann M Patt V Feyer L Plucinski IP Krug M Escher N Weber M Merkel O Renault N Barrett |
| Institution: | 1. Peter Grünberg Institute (PGI-6) and JARA-FIT, Research Center Jülich, D-52425 Jülich, Germany;2. Fakultät f. Physik and Center for Nanointegration Duisburg-Essen (CENIDE), Universität Duisburg-Essen, D-47048 Duisburg, Germany;3. Sincrotrone Trieste S.C.p.A., S.S. 14, km 163.5 in Area Science Park, 34012 Basovizza, Trieste, Italy;4. FOCUS GmbH, D-65510 Hünstetten, Germany;5. DSM/IRAMIS/SPCSI, CEA-Saclay, F-91191 Gif sur Yvette Cedex, France;6. CEA, LETI, MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France |
| Abstract: | The analysis of chemical and electronic states in complex and nanostructured material systems requires electron spectroscopy to be carried out with nanometer lateral resolution, i.e. nanospectroscopy. This goal can be achieved by combining a parallel imaging photoelectron emission microscope with a bandpass energy filter. In this contribution we describe selected experiments employing a dedicated spectromicroscope – the NanoESCA. This instrument has a particular emphasis on the spectroscopic aspects and enables laterally resolved photoelectron spectroscopy from the VUV up into the hard X-ray regime. |
| Keywords: | Photoemission microscopy Immersion lens Spectromicroscopy XPS Fermi surface HAXPES |
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