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Melt-mediated coalescence of solution-deposited ZnO nanoparticles by excimer laser annealing for thin-film transistor fabrication
Authors:Heng Pan  Nipun Misra  Seung H Ko  Costas P Grigoropoulos  Nate Miller  Eugene E Haller and Oscar Dubon
Institution:(1) Laser Thermal Laboratory, Department of Mechanical Engineering, University of California, Berkeley, CA 94720-1740, USA;(2) Department of Materials Science & Engineering, University of California, Berkeley, CA, USA;(3) Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
Abstract:Nanoparticle solutions are considered promising for realizing low cost printable high performance flexible electronics. In this letter, excimer laser annealing (ELA) was employed to induce melting of solution-deposited ZnO nanoparticles and form electrically conductive porous films. The properties of the films were characterized by scanning electron microscopy, high-resolution transmission electron microscopy, DC conductance, and photoluminescence measurements. Thin-film field-effect transistors have been fabricated by ELA without the use of conventional vacuum or any high temperature thermal annealing processes. The transistors show n-type accumulation mode behavior with mobility greater than 0.1 cm2/V s and current on/off ratios of more than 104. Optimization and control of the laser processing parameters minimized thermal impact on the substrate. This technique can be beneficial in the fabrication of metal oxide based electronics on heat sensitive flexible plastic substrates using low-cost, large-area solution processing combined with direct printing techniques.
Keywords:PACS" target="_blank">PACS  81  07  Wx  81  15  -z  81  15  Fg  81  16  -c  81  16  Mk
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