Trap-free lifetime in hopping systems: Neutral traps in PVK |
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| Authors: | J Hirsch AR Tahmasbi |
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| Institution: | Birkbeck College, University of London, London WC1E 7HX, UK |
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| Abstract: | The concentration of deep hole traps in layers of PVK is found to be ≈-1015cm?3. The traps are believed to be neutral. An expression of general validity in hopping transport is derived for the free carrier lifetime before capture by neutral traps. In PVK the lifetime depends on field, but the Schubweg ≈-10?4/T cm2V?1, does not. |
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