Radiation from silver films bombarded by low-energy electrons |
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Authors: | MS Chung TA Callcott E Kretschmann ET Arakawa |
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Institution: | Health and Safety Research Division, Oak Ridge National Laboratory, Oak Ridge, Tenessee 37830, USA |
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Abstract: | Emission spectra from Ag films irradiated by low energy electrons (20–1500 eV) have been measured, and the results compared with theory. For relatively smooth films, two peaks in the spectra are resolved. One at 3.73 eV, the volume plasmon energy, is attributed to transition radiation and/or bremsstrahlung. The second, at about 3.60 eV, is very sensitive to surface roughness in both position and magnitude and is produced by roughness-coupled radiation from surface plasmons. For rough films, the roughness-coupled radiation dominates the emission. In addition to spectral shapes, the polarization of the radiation and its intensity as a function of electron energy were measured. The experimental results are compared with new calculations of roughness-coupled emission which account for most of our observations. They indicate that high wavevector roughness components play the dominant role in the emission process. |
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