Electronic properties of relaxed surfaces,interfaces, overlayer systems and defects at surfaces or interfaces; applications of the scattering theoretic technique期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

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Electronic properties of relaxed surfaces,interfaces, overlayer systems and defects at surfaces or interfaces; applications of the scattering theoretic technique

Authors:	J Pollmann A Mazur M Schmeits

Institution:	Institute of Physics, University of Dortmund, D-4600 Dortmund 50, West Germany;Institute of Physics, University of Liège, Liège, Belgium

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