Elaboration at 80°C of SiO2 Layers Deposited by Aerosol-Gel Process |
| |
Authors: | M. Langlet C. Vautey |
| |
Affiliation: | (1) Laboratoire des Materiaux et du Génie Physique—UMR 5628 CNRS, ENSPG-INPG, BP 46, 38402 Saint Martin d'Hères, France |
| |
Abstract: | The aerosol-gel process is a thin film deposition technique based on the sol-gel polymerization of a liquid film deposited from an ultrasonically sprayed aerosol. SiO2 layers have been deposited by aerosol-gel process from TEOS solutions prepared using a two-step procedure. After a post-treatment at 80°C, the layers have a remarkable abrasion resistance and a high refractive index. In this paper, the chemical mechanisms involved in the formation of SiO2 layers at low temperature are studied by FTIR spectroscopy and related to the processing conditions. |
| |
Keywords: | sol-gel thin film deposition silica layers FTIR spectroscopy ultrasonic pulverization of an aerosol |
本文献已被 SpringerLink 等数据库收录! |