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Elaboration at 80°C of SiO2 Layers Deposited by Aerosol-Gel Process
Authors:M. Langlet  C. Vautey
Affiliation:(1) Laboratoire des Materiaux et du Génie Physique—UMR 5628 CNRS, ENSPG-INPG, BP 46, 38402 Saint Martin d'Hères, France
Abstract:The aerosol-gel process is a thin film deposition technique based on the sol-gel polymerization of a liquid film deposited from an ultrasonically sprayed aerosol. SiO2 layers have been deposited by aerosol-gel process from TEOS solutions prepared using a two-step procedure. After a post-treatment at 80°C, the layers have a remarkable abrasion resistance and a high refractive index. In this paper, the chemical mechanisms involved in the formation of SiO2 layers at low temperature are studied by FTIR spectroscopy and related to the processing conditions.
Keywords:sol-gel thin film deposition  silica layers  FTIR spectroscopy  ultrasonic pulverization of an aerosol
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