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Flexoelectricity induced increase of critical thickness in epitaxial ferroelectric thin films
Authors:Hao Zhou  Jiawang Hong  Yihui Zhang  Faxin Li  Yongmao Pei  Daining Fang
Affiliation:1. State Key Laboratory for Turbulence and Complex Systems, College of Engineering, Peking University, Beijing 100871, China;2. Department of Engineering Mechanics, Tsinghua University, Beijing 100084, China
Abstract:Flexoelectricity describes the coupling between polarization and strain/stress gradients in insulating crystals. In this paper, using the Landau–Ginsburg–Devonshire phenomenological approach, we found that flexoelectricity could increase the theoretical critical thickness in epitaxial BaTiO3 thin films, below which the switchable spontaneous polarization vanishes. This increase is remarkable in tensile films while trivial in compressive films due to the electrostriction caused decrease of potential barrier, which can be easily destroyed by the flexoelectricity, between the ferroelectric state and the paraelectric state in tensile films. In addition, the films are still in a uni-polar state even below the critical thickness due to the flexoelectric effect.
Keywords:Flexoelectricity   Critical thickness   Ferroelectric thin films   Misfit strain   Phenomenology
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