Static dielectric constant assessment from capacitance over a wide range of electrode separations |
| |
| Institution: | 1. School of Material Science and Engineering, Shanghai University, Jiading, Shanghai 201800, PR China;2. Key Laboratory of Advanced Display and System Applications, Ministry of Education, Shanghai University, Shanghai 200072, PR China;1. Department of Chemical Engineering, Soongsil University, Seoul 156-743, Republic of Korea;2. School of Chemical Engineering, Sungkyunkwan University, Suwon 440-746, Republic of Korea;3. SKKU Advanced Institute of Nanotechnology (SAINT), Sungkyunkwan University, Suwon 440-746, Republic of Korea;4. Center for Human Interface Nano Technology (HINT), Sungkyunkwan University, Suwon 440-746, Republic of Korea;1. Laboratory of Infrared Material and Devices, The Research Institute of Advanced Technologies, Ningbo University, Ningbo 315211, China;2. Key Laboratory of Photoelectric Detection Materials and Devices of Zhejiang Province, Ningbo 315211, China |
| |
| Abstract: | Static dielectric constant extraction from two-electrode capacitance measurement over a wide range of electrode separations and dielectric constants involves careful assessment of fringe fields. Finite-element method has been employed to compute capacitance and quantify fringe fields for parallel electrode capacitor of (finite thickness, radii r, electrode separation d), with a homogeneous dielectric medium extending up to the geometric limits of the electrodes. Two distinct regimes, in the fringe field contributions are seen. A procedure to extract the static dielectric constant has been proposed for the first regime and a validation has been provided for the same. |
| |
| Keywords: | Circular disc Capacitance Dielectric constant Fringing fields Parallel electrode capacitor |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
