Quantum oscillations in p-type inversion layers of (111) and (100) silicon field effect transistors |
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Authors: | K von Klitzing G Landwehr G Dorda |
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Institution: | 1. Physikalisches Institut der Universität Würzburg, Würzburg, Germany;2. Hochmagnetfeldanlage der Technischen Universität Braunschweig, Braunschweig, Germany;3. Forschungslaboratorien der Siemens AG, München, Germany |
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Abstract: | For the first time Shubnikov-de Haas oscillations have been observed in p-type inversion layers of (111) and (100) silicon field effect transistors. For both orientations a single electric subband was found. The effective mass of the surface carriers was determined from the temperature dependence of the oscillations, for (111) surfaces as a function of the surface electric field. At low gate voltages spin splitting of the Landau levels was resolved. |
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