Fourier inversion of LEED data |
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Authors: | J.C. Buchholz M.G. Lagally M.B. Webb |
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Affiliation: | College of Engineering, University of Wisconsin, Madison, Wisconsin 53706, U.S.A.;Department of Physics, University of Wisconsin, Madison, Wisconsin 53706, U.S.A. |
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Abstract: | Low-energy electron diffraction intensity profiles are Fourier inverted. The optical transform is more suitable for LEED than the usual cosine transform and yields a quantity related to the autocorrelation function. Transforms of individual LEED profiles taken at different diffraction geometry are not the same, but transforms of averaged, kinematic data give expected autocorrelation functions. |
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