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Small angle X-ray scattering evidence for the absence of voids in chalcogenide glasses

Authors:	SG Bishop NJ Shevchik

Institution:	1. Naval Research Laboratory, Washington D.C. 20375, U.S.A.;2. Max-Planck-Institut für Festkörperforschung, Stuttgart, Federal Republic of Germany

Abstract:	Small angle X-ray scattering measurements show no evidence for the presence of voids in chalcogenide glasses, in contrast to the situation found in deposited films of Ge and Si. This result and the observation of a diffraction peak near $k = 1.2 A ?^{?1}$ are found to be consistent with the existence of a layer structure in glassy As₂S₃ and As₂Se₃.

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