Optical characterization of CdTe/ZnSe fractional monolayer structures grown by atomic layer epitaxy |
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| Authors: | J. Y. Lee J. H. Chang M. Yang H. S. Ahn S. N. Yi K. Goto K. Godo H. Makino M. W. Cho T. Yao J. S. Song |
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| Affiliation: | a Major of Semiconductor Physics, Korea Maritime University, Pusan, South Korea;b Institute for Materials Research, Tohoku University, Sendai, Japan;c Neosemitech Corp., Incheon, South Korea |
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| Abstract: | Luminescence properties of CdTe/ZnSe fractional monolayer grown by atomic layer epitaxy have been investigated. To investigate the origin of the highly efficient luminescence, various optical spectroscopic methods such as, photoluminescence (PL), temporal/spatial resolved PL, temperature dependence PL, and excitation power dependence PL have been used. It is found that structural inhomogeneities affect dominant influence on the line width and line shape of luminescence. The luminescence intensity greatly enhanced by the localization of exciton at the disorder induced localized states. |
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| Keywords: | Exciton localization II– VI compounds |
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