Exciton–dopant and exciton–charge interactions in electronically doped OLEDs |
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Authors: | Christopher Williams Sergey Lee John Ferraris A. Anvar Zakhidov |
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Affiliation: | aDepartment of Physics and UTD-Nanotech Institute, The University of Texas at Dallas, 2601 N.Floyd Road, Richardson, TX 750803-0688, USA bDepartment of Chemistry, UTD, The University of Texas at Dallas, Richardson, TX 75080, USA |
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Abstract: | The electronic dopants, like tetrafluorocyanoquinodimethane (F4–TCNQ) molecules, used for p-doping of hole transport layers in organic light-emitting diodes (OLEDs) are found to quench the electroluminescence (EL) if they diffuse into the emissive layer. We observed EL quenching in OLED with F4-TCNQ doped N,N′-diphenyl-N′N′-bis(1-naphthyl)-1,1′-biphenyl-4,4′-diamine hole transport layer at large dopant concentrations, >5%. To separate the effects of exciton–dopant quenching, from exciton–polaron quenching we have intentionally doped the emissive layer of (8-tris-hydroxyquinoline) with three acceptors (A) of different electron affinities: F4-TCNQ, TCNQ, and C60, and found that C60 is the strongest EL-quencher, while F4-TCNQ is the weakest, contrary to intuitive expectations. The new effects of charge transfer and usually considered energy transfer from exciton to neutral (A) and charged acceptors (A−) are compared as channels for non-radiative Ex–A decay. At high current loads the EL quenching is observed, which is due to decay of Ex on free charge carriers, hole polarons P+. We consider contributions to Ex–P+ interaction by short-range charge transfer and describe the structure of microscopic charge transfer (CT)-processes responsible for it. The formation of metastable states of ‘charged excitons’ (predicted and studied by Agranovich et al. Chem. Phys. 272 (2001) 159) by electron transfer from a P to an Ex is pointed out, and ways to suppress non-radiative Ex–P decay are suggested. |
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Keywords: | Decay Acceptor dopant Polaron Electroluminescence Quenching |
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