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Exciton–dopant and exciton–charge interactions in electronically doped OLEDs
Authors:Christopher Williams   Sergey Lee   John Ferraris  A. Anvar Zakhidov  
Affiliation:

aDepartment of Physics and UTD-Nanotech Institute, The University of Texas at Dallas, 2601 N.Floyd Road, Richardson, TX 750803-0688, USA

bDepartment of Chemistry, UTD, The University of Texas at Dallas, Richardson, TX 75080, USA

Abstract:The electronic dopants, like tetrafluorocyanoquinodimethane (F4–TCNQ) molecules, used for p-doping of hole transport layers in organic light-emitting diodes (OLEDs) are found to quench the electroluminescence (EL) if they diffuse into the emissive layer. We observed EL quenching in OLED with F4-TCNQ doped N,N′-diphenyl-N′N′-bis(1-naphthyl)-1,1′-biphenyl-4,4′-diamine hole transport layer at large dopant concentrations, >5%. To separate the effects of exciton–dopant quenching, from exciton–polaron quenching we have intentionally doped the emissive layer of (8-tris-hydroxyquinoline) with three acceptors (A) of different electron affinities: F4-TCNQ, TCNQ, and C60, and found that C60 is the strongest EL-quencher, while F4-TCNQ is the weakest, contrary to intuitive expectations. The new effects of charge transfer and usually considered energy transfer from exciton to neutral (A) and charged acceptors (A) are compared as channels for non-radiative Ex–A decay. At high current loads the EL quenching is observed, which is due to decay of Ex on free charge carriers, hole polarons P+. We consider contributions to Ex–P+ interaction by short-range charge transfer and describe the structure of microscopic charge transfer (CT)-processes responsible for it. The formation of metastable states of ‘charged excitons’ (predicted and studied by Agranovich et al. Chem. Phys. 272 (2001) 159) by electron transfer from a P to an Ex is pointed out, and ways to suppress non-radiative Ex–P decay are suggested.
Keywords:Decay   Acceptor dopant   Polaron   Electroluminescence   Quenching
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