|
|||||
|
|
Investigation of Porous Silicon Wetting by Raman Scattering |
|
| Authors: | M A Ferrara M G Donato L Sirleto G Messina S Santangelo I Rendina |
| Institution: | 1. National Research Council-Institute for Microelectronics and Microsystems , Naples, Italy;2. University “Mediterranea,” Reggio Calabria , Reggio Calabria, Italy antrorella.ferrara@na.imm.cnr.it;4. University “Mediterranea,” Reggio Calabria , Reggio Calabria, Italy;5. National Research Council-Institute for Microelectronics and Microsystems , Naples, Italy |
| Abstract: | Wetting phenomena in porous silicon layers are experimentally investigated by Raman scattering. The experimental results show a reversible blue-shift of Raman spectra of wetted porous silicon layers with respect to the unperturbed layers. We ascribe the shift to a compressive stress due to the increased lattice mismatch between the porous silicon layer and the bulk silicon substrate in wetting conditions. |
| Keywords: | porous silicon Raman scattering wetting phenomena |