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Surface potential measurement on organic ultrathin film by Kelvin probe force microscopy using a piezoelectric cantilever
Authors:K. Kobayashi   H. Yamada   K. Umeda   T. Horiuchi   S. Watanabe   T. Fujii   S. Hotta  K. Matsushige
Abstract:We measured surface potential (SP) on a ?-conju-gated thiophene oligomer monolayer film deposited on a metallic substrate by Kelvin probe force microscopy using a piezoelectric cantilever. Since the cantilever has a relatively large spring constant (calculated as about 150 N/m), the frequency modulation detection method was used for tip-sample distance regulation in order to achieve high-sensitivity SP measurement. A contact potential difference between monolayer regions and the metallic substrate was clearly observed in an SP image. Furthermore, an apparent change in a contrast of the SP image was observed while the sample was irradiated with ultraviolet light.
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