Influence of the third-order parameter on diffuse reflectance at small source-detector separations |
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Authors: | Tian Huijuan Liu Ying Wang Lijun |
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Institution: | College of Science, Key Laboratory of Opto-electronics Information Technical Science, Ministry of Education, Tianjin University, Tianjin 300072, China. tianhjgx@126.com |
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Abstract: | Spatially resolved reflectance close to source has received a great deal of attention recently. This research is considered to develop a new noninvasive technique for measuring the optical properties of biological media. Using Monte Carlo simulations, we investigated the influence of third-order parameter 5 on diffuse reflectance and found that the reflectance decreased with an increase of delta at a short source-detector separation of approximately 0.7-2 transport mean free paths. We show that the effects of two parameters, y and second-order parameter delta, on the reflectance are contrary. As a result the influence of the second-order parameter y on the reflectance is irregular when the condition delta delta
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