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Finite-size effect in shot noise in hopping conduction |
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| Authors: | E S Tikhonov V S Khrapai D V Shovkun D Schuh |
| Institution: | 1. Institute of Solid State Physics, Russian Academy of Sciences, Chernogolovka, Moscow region, 142432, Russia 2. Moscow Institute of Physics and Technology (State University), Dolgoprudnyi, Moscow region, 141700, Russia 3. Institute of Applied and Experimental Physics, University of Regensburg, D-93040, Regensburg, Germany |
| Abstract: | We study a current shot noise in a macroscopic insulator based on a two-dimensional electron system in GaAs in a variable range hopping (VRH) regime. At low temperature and in a sufficiently depleted sample a shot noise close to a full Poissonian value is measured. This suggests an observation of a finite-size effect in shot noise in the VRH conduction and demonstrates a possibility of accurate quasiparticle charge measurements in the insulating regime. |
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