| X射线荧光光谱法测定聚合物材料中铅和镉 |
| |
| 引用本文： | 王斌,张华,黄伟,冯小军,刘继平. X射线荧光光谱法测定聚合物材料中铅和镉[J]. 理化检验(化学分册), 2012, 0(7): 810-811 |
| |
| 作者姓名： | 王斌 张华 黄伟 冯小军 刘继平 |
| |
| 作者单位： | 东莞出入境检验检疫局;上海思百吉仪器系统有限公司 |
| |
| 摘 要： | 提出了X射线荧光光谱法测定聚合物材料中铅和镉的方法。将粒径小于4mm的样品颗粒置于样品杯中,保持样品厚度大于16mm,加盖后按仪器工作条件进行测定。铅和镉的线性范围依次在1 033μg.g-1和980μg.g-1以内,检出限依次为0.31μg.g-1和0.69μg.g-1。方法用于分析标准物质(ERM-EC680k和ERM-EC681k),测定值与认定值相符。
|
| 关 键 词： | X射线荧光光谱法 聚合物材料 铅 镉 |
XRFS Determination of Lead and Cadmium in Polymeric Materials |
| |
| WANG Bin,ZHANG Hua,HUANG Wei,FENG Xiao-jun,LIU Ji-ping. XRFS Determination of Lead and Cadmium in Polymeric Materials[J]. Physical Testing and Chemical Analysis Part B:Chemical Analgsis, 2012, 0(7): 810-811 |
| |
| Authors: | WANG Bin ZHANG Hua HUANG Wei FENG Xiao-jun LIU Ji-ping |
| |
| Affiliation: | 1(1.Dongguan Entry-Exit Inspection and Quarantine Bureau,Dongguan 523072,China; 2.Shanghai Spectris Instrument System Co.,Ltd.,Shanghai 200233,China) |
| |
| Abstract: | XRFS determination of lead and cadmium in polymeric materials was proposed in this paper.The sample was crusned to granules having granular diameters less than 4 mm and transferred into the sample cup,packing the sample granules to a thickness over 16 mm.After covering the sample cup,XRFS determination was performed according to the prescribed instrumental working condition.Linearity ranges of Pb and Cd were kept in the range within 1 033 μg· g-1 and 980 μg· g-1,with detection limits of 0.31 μg· g-1 and 0.69 μg· g-1 respectively.The proposed method was used in analyzing two standard reference materials(ERM-EC681k and ERM-EC680k),giving results in consistency with the certified values. |
| |
| Keywords: | XRFS Polymeric materials Lead Cadmium |
| 本文献已被 CNKI 等数据库收录！ |
|
