| 静电力显微镜研究二相材料及其界面介电特性 |
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| 引用本文： | 孙志,王暄,韩柏,宋伟,张冬,郭翔宇,雷清泉.静电力显微镜研究二相材料及其界面介电特性[J].物理学报,2013,62(3):30703-030703. |
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| 作者姓名： | 孙志 王暄 韩柏 宋伟 张冬 郭翔宇 雷清泉 |
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| 作者单位： | 哈尔滨理工大学电气与电子工程学院, 黑龙江省电介质工程国家重点实验室培育基地, 工程电介质及其应用教育部重点实验室, 哈尔滨 150080 |
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| 基金项目： | 国家重点基础研究发展计划 (批准号: 2009CB724505)、国家自然科学基金 (批准号: 5097702)、黑龙江省电介质工程国家重点实验室培育基地前沿项目预研基金 (批准号: DE2012B07)和哈尔滨理工大学青年科学研究基金(批准号: 2011YF013)资助的课题. |
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| 摘 要： | 利用静电力显微镜(EFM)研究了二相材料不同区域的介电特性. 制备了高定向石墨/聚乙烯、云母/聚乙烯等层叠状二相材料复合物, 在EFM相位检测模式下观测二相材料过渡界面处, 可以发现二相材料中介电常数较大的材料会引起较大的相位滞后角Δθ该相位滞后角正切值tan(Δθ) 与探针电压VEFM存在二次函数关系, 且函数二次项系数与样品的介电常数存在增函数关系, 进而可在微纳米尺度下区分不同微区域内材料的介电常数差异. 研究表明EFM 可用于对材料介电特性的微纳米尺度测量, 这对分析复合材料二相界面区域特性有积极意义.
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| 关 键 词： | 静电力显微镜 界面 介电常数 |
| 收稿时间： | 2012-08-28 |
Dielectric property of binary phase composite and its interface investigated by electric force microscope |
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| Sun Zhi,Wang Xuan,Han Bai,Song Wei,Zhang Dong,Guo Xiang-Yu,Lei Qing-Quan.Dielectric property of binary phase composite and its interface investigated by electric force microscope[J].Acta Physica Sinica,2013,62(3):30703-030703. |
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| Authors: | Sun Zhi Wang Xuan Han Bai Song Wei Zhang Dong Guo Xiang-Yu Lei Qing-Quan |
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| Institution: | College of Electrical and Electronic Engineer, Harbin University of Science and Technology, State Key Laboratory Breeding Base of Dielectrics Engineering, Key Laboratory of Engineering Dielectrics and Its Application, Ministry of Education, Harbin 150080, China |
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| Abstract: | Dielectric property of two-phase stack-up sample is studied by electric force microscopy (EFM). Highly oriented pyrolytic graphite (HOPG)/polyethylene(PE) and mica/PE are fabricated. The phenomenon that phase shift (Δθ) of conducting probe varys with dielectric constant of material is discovered near the interface between the two materials by using phase detection EFM. The characteristic curves of tan(Δθ) versus tip voltage VEFM are of parabolic type. Quadratic coefficient increases with dielectric constant ε increasing. An approach to the qualitative analysis of the dielectric property near the interface between different material at the micro/nanometer scale, is provided in this paper. |
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| Keywords: | electric force microscope interface dielectric constant |
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