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Simulation of resistance switching of memory cells based on solid electrolyte
Authors:X.F. Liang  X.H. Kong  S.T. Zhang  W. Yang
Affiliation:
  • College of Information Technology, Shanghai Ocean University, Shanghai 201306, People’s Republic of China
  • Abstract:The electrochemical reaction induced resistance switching of memory cells based on solid electrolyte is simulated by an interface-tracking method using a two-dimensional model. For the switching-on process, the simulating results show that metal dendrites will be formed in the solid electrolyte, switching the device to a low-resistance state. For the switching-off process, the dendrite will be dissolved and the conductive channel eventually breaks down, switching the device to a high-resistance state.
    Keywords:A. Insulators   A. Thin films
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