Simulation of resistance switching of memory cells based on solid electrolyte |
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Authors: | X.F. Liang X.H. Kong S.T. Zhang W. Yang |
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Affiliation: | College of Information Technology, Shanghai Ocean University, Shanghai 201306, People’s Republic of China |
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Abstract: | The electrochemical reaction induced resistance switching of memory cells based on solid electrolyte is simulated by an interface-tracking method using a two-dimensional model. For the switching-on process, the simulating results show that metal dendrites will be formed in the solid electrolyte, switching the device to a low-resistance state. For the switching-off process, the dendrite will be dissolved and the conductive channel eventually breaks down, switching the device to a high-resistance state. |
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Keywords: | A. Insulators A. Thin films |
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