Influenceof the thermal degradation on the dielectric properties of a thermoset

The thermal degradation of an epoxy system consisting of a diglycidyl ether of bisphenol A (DGEBA, n=0) and m-xylylenediamine (m-XDA) was studied by both thermogravimetric analysis (TG) and dielectric analysis (DEA). It has been checked a deviation of the typical behaviour in the Arrhenius plot expected for this kind of systems, owing to the thermal degradation. Both, structural relaxation time and conductivity values, were represented as a function of the mass loss, that allow a relationship to be obtained between characteristic relaxation time and the degree of degradation at the beginning of the degradation process.