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Far infrared reflection spectra in narrow-gap semiconductors
Authors:Kenji Kumazaki
Affiliation:(1) Department of Engineering Science, Hokkaido Institute of Technology, Teine, 061-24 Sapporo, Japan
Abstract:Far infrared reflection spectra of CdXHg1–X Se are measured in the region 20 to 600 cm–1 at temperatures between 5 and 77 K. Reflection spectra are explained well by the dynamic dielectric function which is constructed as a sum of Gamma8Gamma8 interband, intraband and phonon contributions. The plasmon-LO phonon coupling effect is also discussed.
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