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SOI全介质隔离与高频互补双极兼容工艺
引用本文:王界平,王清平.SOI全介质隔离与高频互补双极兼容工艺[J].微电子学,1996,26(3):150-152.
作者姓名:王界平  王清平
作者单位:电子工业部第24研究所
摘    要:SOI材料的全介质隔离技术与高频互补双极工艺的结合是研制抗辐照能力强、频带宽、速度高的集成运算放大器的理想途径,从实验的角度提出了一种SOI材料全介质隔离与高频互补双极工艺兼容的工艺途径。

关 键 词:SOI材料  全介质隔离  工艺  高频互补双极

A Compatible Technology of SOI Full Dielectric Isolation with Complementary Bipolar Process
WANG Jieping and WANG Qingping.A Compatible Technology of SOI Full Dielectric Isolation with Complementary Bipolar Process[J].Microelectronics,1996,26(3):150-152.
Authors:WANG Jieping and WANG Qingping
Abstract:To develop a new generation of wide-band, high-speed operational amplifier, new approaches are needed. The high-frequency complementary bipolar process has the advantage of achieving high fT npn and pup transistors with extremely small parasitic capacitance,and siliconon-insulator full dielectric isolation is an excellent isolation technique.Combining the two processes, a compatible technology of SOI full dielectric isolation and complementary bipolar process is experimented. Vertical pup and npn transistors with fT up to 1 GHz have been fabricated in the experimentation.
Keywords:Semiconductor process  SOI  Full dielectric isolation  Complementary bipolar process  High-speed operational amplifier IC
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