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TEM Orientation Mapping Applied to the Study of Shear Band Formation
Authors:Henryk?Paul  author-information"  >  author-information__contact u-icon-before"  >  mailto:nmpaul@imim-pan.krakow.pl"   title="  nmpaul@imim-pan.krakow.pl"   itemprop="  email"   data-track="  click"   data-track-action="  Email author"   data-track-label="  "  >Email author,Adam?Morawiec,Emmanuel?Bouzy,Jean-Jacques?Fundenberger,Andrzej?Pi?tkowski
Affiliation:(1) Institute of Metallurgy and Materials Science, Polish Academy of Sciences, PL-30-059 Kraków, Poland;(2) Laboratoire d"rsquo"Etude des Textures et Applications aux Matériaux, F-57045 CNRS Metz, France
Abstract:The formation of brass-type shear bands (SBs) in twinned microstructures of ${rm C} { 112 } langle 111 rangle $ oriented copper single crystals, has been investigated after channel-die deformation at 77thinspK. Setting up a system for making high-resolution orientation maps using transmission electron microscopy (TEM) has opened new advantageous circumstances for the analysis of orientation changes within SBs. This method with spatial resolution higher than 10thinspnm allows an examination of microstructure images composed of nanoscale sub-cells forming SBs structure. The early stages of SBs formation are the result of equally effective operation of two slip systems operating on the {111} slip planes which could be represented by a lsquoresultant super-systemrsquo of ${ 111 } langle 112 rangle$ type. This process leads to the lattice rotation about $langle 110 rangle $ axis and to the rise of Goss orientation within the band. A minor group of components is observed near ${ 114 } langle 221 rangle $, arising from the near primary matrix orientation. For well-developed SBs, a second rotation about $ langle 112 rangle $ direction is observed. This tendency, resulting from the ${ 111 } langle 110 rangle $ type slip systems operation, is usually accompanied by activation of new slip systems. Hence the process of SBs formation is regarded as a strictly crystallographic one.
Keywords:: Shear bands   copper   microtexture   electron diffraction   orientation imaging maps.
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