| Atomic resolution in noncontact AFM by probing cantilever frequency shifts |
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| 引用本文： | Hong Yong Xie. Atomic resolution in noncontact AFM by probing cantilever frequency shifts[J]. 中国颗粒学报, 2007, 5(3): 242-246. DOI: 10.1016/j.cpart.2006.09.001 |
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| 作者姓名： | Hong Yong Xie |
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| 作者单位： | Department of Environmental Engineering, Shanghai Second Polytechnic University, 2360 Jin Hai Road, Pudong Shanghai 201209, China |
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| 基金项目： | The author is grateful for a research grant from Material Science and Engineering Fund and a research grant from NanoMaterials and Science Fund of Dalian University of Technology. |
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| 摘 要： | Rutile TiO2 （001） quantum dots （or nano-marks） in different shapes were used to imitate uncleaved material surfaces or materials with rough surfaces. By numerical integration of the equation of motion of cantilever for silicon tip scanning along the [110] direction over the rutile TiO2 （001） quantum dots in ultra high vacuum （UHV）, scanning routes were explored to achieve atomic resolution from frequency shift image. The tip-surface interaction forces were calculated from Lennard-Jones （12-6） potential by the Hamaker summation method. The calculated results showed that atomic resolution could be achieved by frequency shift image for TiO2 （001） surfaces of rhombohedral quantum dot scanning in a vertical route, and spherical cap quantum dot scanning in a superposition route.2007 Chinese Society of Particuology and Institute of Process Engineering, Chinese Academy of Sciences. Published by Elsevier B.V.
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| 关 键 词： | 量子论 原子能理论 频率 移动方法 |
| 收稿时间： | 2005-07-13 |
| 修稿时间： | 2005-07-132006-09-30 |
Atomic resolution in noncontact AFM by probing cantilever frequency shifts |
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| Hong Yong Xie. Atomic resolution in noncontact AFM by probing cantilever frequency shifts[J]. China Particuology, 2007, 5(3): 242-246. DOI: 10.1016/j.cpart.2006.09.001 |
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| Authors: | Hong Yong Xie |
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| Affiliation: | Department of Environmental Engineering, Shanghai Second Polytechnic University, 2360 Jin Hai Road, Pudong Shanghai 201209, China |
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| Abstract: | Rutile TiO2(001) quantum dots (or nano-marks) in different shapes were used to imitate uncleaved material surfaces or materials with rough surfaces. By numerical integration of the equation of motion of cantilever for silicon tip scanning along the [110] direction over the rutile TiO2 (001) quantum dots in ultra high vacuum (UHV), scanning routes were explored to achieve atomic resolution from frequency shift image. The tip-surface interaction forces were calculated from Lennard-Jones (12-6) potential by the Hamaker summation method. The calculated results showed that atomic resolution could be achieved by frequency shift image for TiO2 (001) surfaces of rhombohedral quantum dot scanning in a vertical route, and spherical cap quantum dot scanning in a superposition route. |
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| Keywords: | Nc-AFM Frequency shift image Atomic resolution Quantum dots Uncleaved material surface |
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