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Excess thermal-noise in the electrical breakdown of random resistor networks |
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| Authors: | C. Pennetta L.B. Kiss Z. Gingl L. Reggiani |
| Affiliation: | (1) Dipartimento Scienza Materiali, Università di Lecce, Via Arnesano, 73100 Lecce, Italy, IT;(2) Istituto Nazionale di Fisica della Materia (INFM), Italy, IT;(3) Uppsala University, Material Science Department, Angstrom Laboratory, Box 534, 75121 Uppsala, Sweden, SE;(4) JATE University, Department of Experimental Physics, Dom ter 9, 6720 Szeged, Hungary, HU |
| Abstract: | We discuss a new type of excess noise strongly sensitive to non-homogeneous Joule heating of random resistor network and associated with local sources of thermal noise. The evolution of the network towards an electrical breakdown of conductor-insulator type is then studied by using a biased percolation model and it is analysed in terms of an excess-noise temperature. Monte Carlo simulation results show a significant increase of the excess-noise temperature over the average temperature of the network. Remarkably the excess-noise temperature scales with the resistance with an exponent of about 3. The predictivity of the model can be tested on thin film resistors where the determination of the excess noise temperature should provide a valuable indicator of the defectiveness of the film. Received 13 April 1999 and Received in final form 7 May 1999 |
| Keywords: | PACS. 72.70.+m Noise processes and phenomena[:AND:]73.61.-r Electrical properties of specific thin films and layer structures (multilayers superlattices quantum wells wires and dots) - 81.70.Cv Nondestructive testing: ultrasonic testing photoacoustic testing |
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