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小角X光散射中干涉效应的判断与处理
引用本文:李志宏,吴忠华,吴自玉,吴东.小角X光散射中干涉效应的判断与处理[J].光散射学报,2005,17(4):384-387.
作者姓名:李志宏  吴忠华  吴自玉  吴东
作者单位:1. 中国科学院北京高能物理研究所,同步辐射实验室,北京,100039
2. 中国科学院山西煤炭化学研究所,煤转化国家重点实验室,太原,030001
基金项目:杰出青年基金(10125523),国家自然科学基金(10374887)中国博士后科学基金资助(20040350101)
摘    要:小角X光散射是当X光照射到物质上时发生的在原光束附近小角度范围内的电子相干散射,凡是存在纳米尺度的电子密度不均匀区的物质均会产生小角X光散射现象,因此它是表征纳米、多孔材料结构的理想手段。SAXS中的有关理论一般仅适用于稀疏体系,对于密集体系,往往会产生干涉现象。本文简要总结了目前文献中有关干涉效应的判断与处理方法。

关 键 词:小角X光散射  密集体系  干涉效应
文章编号:1004-5929(2005)04-0384-04
收稿时间:2005-06-06
修稿时间:2005年6月6日

Methods to Distinguish and Handle the Interference in SAXS
LI Zhi-hong,WU Zhong-hua,WU Zi-yu,WU Dong.Methods to Distinguish and Handle the Interference in SAXS[J].Chinese Journal of Light Scattering,2005,17(4):384-387.
Authors:LI Zhi-hong  WU Zhong-hua  WU Zi-yu  WU Dong
Institution:1. Facility of Synchrotron Radiation, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100039, P. O. Box 918, P R China ; 2. State Key Laboratory of Coal Conversion, Institute of Coal Chemistry, Chinese Academy of Sciences, Taiyuan 030001, P. O. Box 165, P R China
Abstract:Small angle X-ray scattering(SAXS) originates from spatial fluctuations of the electronic density within a material.It is ideally suitable for investigating the geometric structure of inhomogeneous material containing regions in which fluctuation or variation in electron density extends over distances of about 0.4nm to 200nm(e.g.particulate or porous materials).Most theories in SAXS are only applicable to sparse systems.For concentrated systems,there will appear interference to scattered intensities.This short paper briefly introduces the methods to distinguish and handle the interference in SAXS literatures.
Keywords:Small angle X-ray scattering  concentrated systems  interference  
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