Toyota Central Research and Development, Labs. Inc., Nagakute-cho, Aichi-ken, 480-11, Japan
Abstract:
Rutherford backscattering/channeling has been applied to study structures of as-deposited epitaxial YBa2Cu3Ox thin films prepared on {100}SrTiO3 by laser deposition. The epitaxial growth has been proved by a planar channeling experiment and transmission electron microscopy. An axial angular yield profile for barium along the c-axis has ideal characters of compensating shoulders and of a flat region at the bottom of the channeling dip. The thermal vibration amplitude, which has been determined from a half-angle of the axial angular yield profile by using Gemmell's channeling model for polyatomic crystals, is compared to those from diffraction experiments.