Near-field optical imaging using force detection with new tip-electrode geometry

We propose a new tip-electrode geometry to detect an (optical) evanescent field using noncontact atomic force microscopy. Using a semi-transparent metal electrode on the prism surface, the force sensitivity due to evanescent field in new tip-electrode geometry was enhanced by a factor of about 1000, comparing with that in old tip-electrode geometry where electrode was located behind the prism. Furthermore, this tip-electrode geometry avoids the electrostatic field caused by the residual charges and contact-electrified charges near the prism surface, which affects the force sensitivity due to evanescent field. We demonstrated the high resolution imaging of the evanescent field on the Au film with 15-nm (λ/33) lateral resolution.