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Recent progress on sum-frequency spectroscopy |
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| Affiliation: | 1. Department of Materials Science and Engineering, Tokyo Institute of Technology, O-okayama, Meguro-ku, Tokyo 152-8552, Japan;2. Department of Chemistry, Shanghai University, Shanghai 200444, China;3. Department of Chemistry and Materials Engineering, Faculty of Chemistry, Materials and Bioengineering, Kansai University, Suita, Osaka 564-8680, Japan;4. Department of Physics, Sogang University, Seoul 121-742, Republic of Korea;1. University of Tsukuba, Tsukuba, Japan;2. The University of Tokyo, Tokyo, Japan |
| Abstract: | Second harmonic generation (SHG) and sum frequency spectroscopy (SFS) have provided unique opportunities to probe surfaces and interfaces. They have found broad applications in many disciplines of science and technology. In recent years, there has been significant progress in the development of SHG/SFS technology that has significantly broadened the applications of SHG and SFS. In this article, we review the recent progress of the field with emphasis on SFS. |
| Keywords: | Second harmonic generation Sum frequency spectroscopy Surface and interface |
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