| BiI3-nylon11纳米复合材料的XPS及ATR-IR分析 |
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| 引用本文： | 赵志娟,刘 芬,赵良仲. BiI3-nylon11纳米复合材料的XPS及ATR-IR分析[J]. 分析测试技术与仪器, 2011, 17(1): 42-46 |
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| 作者姓名： | 赵志娟 刘 芬 赵良仲 |
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| 作者单位： | 中国科学院 化学研究所，北京 100190 |
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| 摘 要： | 用X射线光电子能谱法（XPS）测定了BiI3与nylon11作用生成纳米复合材料后聚合物中酰胺基团的N、O内层能级电子结合能变化，同时用衰减全反射红外光谱法（ATR-IR）研究了BiI3-nylon11复合材料中BiI3对尼龙酰胺基团之间氢键作用的影响.结果表明，与纯nylon11聚合物相比，BiI3-nylon11纳米复合材料中N1s、O1s的结合能要稍高一些；N-H伸缩振动、酰胺I谱带、酰胺II谱带振动频率在X射线照射前均发生显著位移，而X射线照射后没有明显的变化，只是谱带变宽.另一方面，无论X射线照射与否，CH2伸缩振动基本不变.实验所得结果对于理解聚合物中氢键相互作用及其对复合材料的结构和性能的影响有一定意义.
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| 关 键 词： | 纳米复合材料 X射线光电子能谱 衰减全反射红外光谱 |
| 收稿时间： | 2010-09-08 |
| 修稿时间： | 2010-10-21 |
XPS and ATR-IR Analysis of BiI3-nylon11 Nanocomposites |
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| ZHAO Zhi-juan,LIU Fen and ZHAO Liang-zhong. XPS and ATR-IR Analysis of BiI3-nylon11 Nanocomposites[J]. Analysis and Testing Technology and Instruments, 2011, 17(1): 42-46 |
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| Authors: | ZHAO Zhi-juan LIU Fen ZHAO Liang-zhong |
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| Affiliation: | Institute of Chemistry, Chinese Academy of Sciences, Beijing 100190, China |
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| Abstract: | XPS was used to measure the shifts of N1s and O1s binding energies in the amide group of nylon11 combined with BiI3 nanoparticles.Besides,attenuated total reflection infrared spectroscopy was used to study the complex effect of BiI3 on hydrogen bonding in polyamide.Compared with nylon11,higher binding energies of N1s and O1s in BiI3-nylon11 nanocomposites were observed.Before X-ray exposure,the N-H stretch frequency,amide I mode,and amide II mode in the vibrational spectra of BiI3-nylon11 nanocomposits shif... |
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| Keywords: | nanocomposite X-ray photoelectron spectroscopy attenuated total reflection infrared spectroscopy |
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