Composition spread metal thin film fabrication technique based on ion beam sputter deposition |
| |
Authors: | P. Ahmet T. Nagata S. Yagyu M. Yoshitake |
| |
Affiliation: | a Nanomaterials Laboratory, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan b CREST-Japan Science and Technology Corporation, Japan |
| |
Abstract: | A composition spread metal thin film fabrication technique based on ion beam sputter deposition method was developed. The technique enables us to fabricate any desired part or a complete binary/ternary composition spread metal thin films onto a single substrate by sequentially sputtering different target materials. Composition spread metal thin films can be deposited directly on a dielectric film in patterned electrode shape for C-V and I-V measurements. The system could be especially useful in the search for new multi-component metal gate materials. |
| |
Keywords: | 85.40.Sz 81.15.Cd 81.30.Bx 85.40.Ls 73.40.Qv |
本文献已被 ScienceDirect 等数据库收录! |