Characterization of Ag nanoparticles on Si wafer prepared using Tollen's reagent and acid-etching |
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Authors: | Dong Chan Lim Young Dok Kim |
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Institution: | a Department of Physics, University of Konstanz, D-78457 Konstanz, Germany b Division of Nano Science and Department of Chemistry, Ewha Womans University, 120-750 Seoul, Republic of Korea |
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Abstract: | Ag nanoparticles on SiO2/Si surfaces synthesized using the Tollen's reagent and a subsequent acid-etching were characterized using X-ray photoelectron spectroscopy (XPS). Combining the reduction of the Tollen's reagent and the chemical etching, one can create naked Ag nanoparticles with various sizes in the size range below ∼10 nanometers (nm). The reduced particle size by the chemical etching was identified using positive core level shifts with increasing etching time. Ag nanoparticles smaller than ∼3 nm undergo a reversible oxidation and reduction cycle by reacting with H2O2/H2O and a subsequent heating under vacuum to 150 °C, which was not found for the bulk counterparts and larger particles, demonstrating unique chemical properties of nanoparticles compared to the bulk counterparts. |
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Keywords: | Ag Nanoparticle Oxidation XPS |
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