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Structure of the SiC (0 0 0 1) 3 × 3 reconstruction studied by surface X-ray diffraction |
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| Authors: | W. Voegeli K. Akimoto K. Sumitani H. Tajiri Y. Hisada X. Zhang H. Kawata |
| Affiliation: | a Department of Quantum Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan b Institute for Solid State Physics, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa 277-8581, Japan c DENSO CORPORATION, 500-1 Minamiyama, Komenoki-cho, Nisshin, Aichi 470-0111, Japan d Photon Factory, High Energy Accelerator Research Organization, Tsukuba 305-0801, Japan |
| Abstract: | The surface structure of the 3 × 3 reconstruction of the 4H-SiC (0 0 0 1) surface was investigated with surface X-ray diffraction (SXRD).Of the studied models, the twist model proposed by Starke et al. [U. Starke, J. Schardt, J. Bernhardt, M. Franke, K. Reuter, H. Wedler, K. Heinz, J. Furthmuller, P. Kackell, F. Bechstedt, Phys. Rev. Lett. 80 (1998) 758] gave the best fit to the experimental data. The structural parameters were determined accurately. |
| Keywords: | 68.35.Bs 68.47.Fg |
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