A transmission electron microscopy study on the atomic arrangement and grain growth of hexagonal structured Ge2Sb2Te5 |
| |
Authors: | Yu Jin Park Yong Tae Kim |
| |
Affiliation: | a Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 305-701, Republic of Korea b Semiconductor Materials and Devices Laboratory, Korea Institute of Science and Technology, Seoul 136-791, Republic of Korea |
| |
Abstract: | The atomic arrangement and grain growth of the hexagonal structured Ge2Sb2Te5 were investigated by a transmission electron microscopy study. Unlike the isotropic crystallization of face-centered-cubic (fcc) structured Ge2Sb2Te5, the hexagonal structured Ge2Sb2Te5 grain was preferably grown to a large degree with a specific direction. As a result, we have revealed that the grain growth occurred parallel to the (0 0 0 1) plane, and identified the atomic arrangement of the hexagonal structured Ge2Sb2Te5 having nine cyclic layers by analyzing the high-resolution transmission electron microscopy images and simulated images obtained in the direction of zone axis. |
| |
Keywords: | 68.37.Lp 68.55.Jk 61.50.Ks |
本文献已被 ScienceDirect 等数据库收录! |
|